I. Structural features                                                      

       ST2253 Digital Four Probe Tester           ST2253 Connected to PC for Operation

        Four probe probe for thin film material testing             Four probe probe for silicon material testing

 II Overview                                                                      

ST2253 digital four probe tester is a multi-purpose comprehensive measuring instrument that uses the four probe measuring principle to test resistivity/square resistance. The instrument is designed in accordance with GB/T 1551-2009 Method for Measuring Resistivity of Silicon Single Crystals, GB/T 1552-1995 DC Four Probe Method for Measuring Resistivity of Silicon and Germanium Single Crystals, and the American A.S.T.M standard.

The instrument consists of a host, an optional four probe probe, a test bench and PC software.

The host is mainly composed of a precision constant current source, a high-resolution ADC, an embedded microcontroller system, and a USB communication interface. All parameter settings and function conversion of the instrument host are input by digital keyboard and digital switch; It has zero position and full degree self calibration functions; The test function can be in automatic/manual mode; The instrument operation can be completed on the PC by the supporting software, or it can be completed independently on the four probe instrument panel by the detachable PC. The test result data is directly displayed by the host digital tube, or can be synchronously displayed, analyzed, saved and printed by the software interface!

Probe selection: according to the requirements of different material characteristics, there are many types of probes available. It has a high wear-resistant tungsten carbide probe probe to test the resistivity/square resistance of hard materials such as silicon semiconductors, metals and conductive plastics; There is also a spherical gold-plated copper alloy probe probe, which can measure the resistivity/square resistance of semiconductor materials such as conductive films of flexible materials, metal coatings or films, conductive films (ITO films) or nano coatings on substrates such as ceramics or glass. With the four terminal test fixture, the resistance of the resistor body, the low and median resistance of the metal conductor and the contact resistance of the switch can also be measured. With a special probe, it can also test the resistivity of the coating on the foil such as the battery pole piece.

Selection of test bench: SZT-C or SZT-F type test bench is generally used to test resistivity by four probe method/square resistance. SZT-K test bench is selected for resistivity test by two probe method, or SZT-D test bench can be selected to test the resistivity of semiconductor powder, or SZT-G test bench can be selected to test the resistivity of rubber and plastic materials.

The instrument is characterized by high measurement accuracy, high sensitivity, good stability, high intelligence, simple measurement, compact structure and convenient use.

 III. Basic Technical Parameters                                     

3.1 Measuring range

Resistance: 1 × 10^-4～2 × 10⁵ Ω, resolution: 1 × 10^-5～1 × 10² Ω

Resistivity: 1 × 10^-4～2 × 10⁵ Ω - cm, resolution: 1 × 10^-5～1 × 10² Ω-cm

Square resistance: 5 × 10^-4～2 × 10⁵ Ω/□, resolution: 5 × 10^-5～1 × 10² Ω/□

3.2 Material size (determined by the test bench and test method)

Diameter: Φ 15~180mm, unlimited handheld mode

Direct test mode of SZT-B/C/F square test bench 180mm × 180mm, unlimited handheld mode

Length (height): direct test mode of test bench H ≤ 160mm, handheld mode is not limited

Measuring orientation: both axial and radial

3.3 4-1/2-digit digital voltmeter:

(1) Range: 20.00mV ～ 2000mV

(2) Error: ± 0.1% Reading ± 2 words

3.4 CNC constant current source

(1) Range: 0.1 μ A，1 μ A，10 μ A，100µA，1mA，10mA，100mA，1A

(2) Error: ± 0.1% Reading ± 2 words

3.5 Four probe probe (select one or add all)

(1) Tungsten Carbide Probe: Φ 0.5mm, linear probe spacing 1.0mm, probe pressure: 0 ～ 2kg adjustable

(2) Thin film square resistance probe: Φ 0.7mm, linear or square probe spacing 2.0mm, probe pressure: 0 ～ 0.6kg adjustable

3.6. Power supply

Input: AC 220V(110V) ± 10%, 50Hz(60Hz) Power consumption:<20W

3.7. Overall dimensions:

Host 220mm (long) × 245 mm wide × 100mm high

Net weight: ≤ 2.5kg

 IV. Contact information and purchase channels:                           

Sales Manager: Grace Zheng

Tel.:+8618762109211

Email: zhengjingjing@szjgdz888.com

Alibaba Store: https://szjgdz.en.alibaba.com